Atomic Level Analysis of Surfaces by a Scanning Atom Probe (SAP)
نویسندگان
چکیده
منابع مشابه
Cold-atom scanning probe microscopy.
Scanning probe microscopes are widely used to study surfaces with atomic resolution in many areas of nanoscience. Ultracold atomic gases trapped in electromagnetic potentials can be used to study electromagnetic interactions between the atoms and nearby surfaces in chip-based systems. Here we demonstrate a new type of scanning probe microscope that combines these two areas of research by using ...
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Figure 2. Angular distributions of inelastic scattering around the undiffracted beam and around a beam diffracted through an angle a. The shaded area represents the contribution from the diffracted beam to the intensity collected by an on-axis aperture of semi-angle A3. [6] Egerton, R. F., Electron Energy Loss Spectroscopy in the Electron Microscope, Plenum Press, New York (1986). [7] Steele, J...
متن کاملStudying of various nanolithography methods by using Scanning Probe Microscope
The Scanning Probe Microscopes (SPMs) based lithographic techniques have been demonstrated as an extremely capable patterning tool. Manipulating surfaces, creating atomic assembly, fabricating chemical patterns, imaging topography and characterizing various mechanical properties of materials in nanometer regime are enabled by this technique. In this paper, a qualified overview of diverse lithog...
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We use a small Bose-Einstein condensate on an atom chip as an interferometric scanning probe to map out a microwave field near the chip surface with a few micrometers resolution. With the use of entanglement between the atoms, our interferometer overcomes the standard quantum limit of interferometry by 4 dB and maintains enhanced performance for interrogation times up to 10 ms. This corresponds...
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ژورنال
عنوان ژورنال: Zairyo-to-Kankyo
سال: 1999
ISSN: 0917-0480,1881-9664
DOI: 10.3323/jcorr1991.48.414